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Multiuser equipment granted in the Project Fapesp 2017/11986-5: interface controler for atomic force microscope

Grant number: 19/23181-7
Support type:Multi-user Equipment Program
Duration: December 01, 2019 - November 30, 2026
Field of knowledge:Physical Sciences and Mathematics - Chemistry
Principal Investigator:Ana Flávia Nogueira
Grantee:Ana Flávia Nogueira
Home Institution: Instituto de Química (IQ). Universidade Estadual de Campinas (UNICAMP). Campinas , SP, Brazil
Associated research grant:17/11986-5 - Research Division 1 - dense energy carriers, AP.PCPE
As informações de acesso ao Equipamento Multiusuário são de responsabilidade do Pesquisador responsável
EMU web page: Página do Equipamento Multiusuário não informada
Tipo de equipamento:Caracterização de Materiais - Análises de Superficies - Microscopia de sonda (AFM, STM)
Fabricante: Fabricante não informado
Modelo: Modelo não informado

Abstract

Atomic force microscopy (AFM) is a microscopy widely used for surface analysis of films, particularly organic films such as polymers and very thin films such as graphene films. The Kelvin probe force microscopy is a variant of the AFM and very important for analysing areas with different potentials on the film surface, allowing the location of regions of higher or lower electron density. This variant of traditional AFM microscopy measures the work function between sample and contact. With this new configuration being requested it will be possible to make images with higher resolution for the identification of different phases, components, as well as with much greater sensitivity for Kelvin measurements. (AU)