Coatings of Titanium, Niobium, and their Alloys on AISI 316L Stainless Steel and Titanium

• Grant number: 17/25983-8
• Support type: Regular Research Grants
• Duration: April 01, 2018 - March 31, 2021
• Field of knowledge: Engineering - Materials and Metallurgical Engineering - Physical Metallurgy
• Principal researcher: Pedro Augusto de Paula Nascente
• Grantee: Pedro Augusto de Paula Nascente
• Home Institution: Centro de Ciências Exatas e de Tecnologia (CCET). Universidade Federal de São Carlos (UFSCAR). São Carlos , SP, Brazil
• Assoc. researchers: Conrado Ramos Moreira Afonso ; Denise Aparecida Tallarico Guelli Lopes ; Haroldo Cavalcanti Pinto ; Pedro Iris Paulin Filho ; Valmor Roberto Mastelaro

Abstract

This project involves the production and characterization of coatings (thin films) of titanium, niobium, and their binary alloys (TixNb1-x) deposited on AISI 316L steel and commercially pure titanium (Ti cp) substrates. The film growth will be carried out by magnetron sputtering, and the characterization, by X-ray photoelectron spectroscopy (X)S), atomic force microscopy (AFM), X-ray diffraction (XRD), scanning electron microscopy (SEM), energy dispersive spectroscopy (EDS), time-of-flight secondary ions mass spectroscopy (ToF-SIMS), and transmission electron microscopy (TEM), as well mechanical tests for nanohardness and elastic modulus measurements, and electrochemical tests. It will be studied the structures, morphologies, surface compositions, mechanical characteristics, and corrosion resistances of the thin films. (AU)

Scientific publications

(References retrieved automatically from Web of Science and SciELO through information on FAPESP grants and their corresponding numbers as mentioned in the publications by the authors)

PANCOTTI, A.; SILVA, J. J.; DE SIERVO, A.; LANDERS, R.; NASCENTE, P. A. P. Surface structure characterization of a (root 5 x root 5)-R26.6 degrees reconstruction of strontium titanate (001) by X-ray photoelectron diffraction. Surface Science, v. 715, JAN 2022. Web of Science Citations: 0.

PANCOTTI, A.; DE SIERVO, A.; CARAZZOLLE, M. F.; SILVA, J. J.; NASCENTE, P. A. P.; LANDERS, R. Surface structure characterization by X-ray photoelectron diffraction of Sn ultra-thin films deposited on Pd(111). Surface Science, v. 685, p. 7-12, JUL 2019. Web of Science Citations: 2.

GONZALEZ, E. DAVID; AFONSO, CONRADO R. M.; NASCENTE, PEDRO A. P. Nanostructural characterization of sputter deposited Ti-Nb coatings byautomated crystallographic orientation mapping. Thin Solid Films, v. 661, p. 92-97, SEP 1 2018. Web of Science Citations: 0.