An Electrical Impedance Tomography (EIT) device allows us to obtain images of the interior of a body through electric potential measurements in the electrodes on the contour of the body, when a current density is applied to an electrode following a load (or current) pattern. Uncertainties due to external influences and measurement devices are associated with the potential values. Other sources of uncertainties can be found related, for instance, to applied electrical currents. Therefore, the image will be associated with a reliability level, that is, there will be a probability of the image to represent the interior of body. In his Master of Sciences work, the author implemented a deterministic algorithm based on Topology Optimization Method (TOM) applied to obtain three-dimensional EIT images. This work encouraged further studies on related topics. The mentioned uncertain nature of the variables, previously neglected, had motivated a new study. Therefore, the objective of this project is to study TOM based on probabilistic methods to obtain reliable TIE images, given the inherent uncertainties.
News published in Agência FAPESP Newsletter about the scholarship: