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Study of the optical and electrical behavior of advanced ceramic nanocomposites of CaCu3Ti4O12/ reduced graphene oxide

Grant number: 18/24465-6
Support type:Scholarships in Brazil - Master
Effective date (Start): March 01, 2019
Effective date (End): August 31, 2020
Field of knowledge:Engineering - Materials and Metallurgical Engineering
Principal Investigator:Miguel Ángel Ramírez Gil
Grantee:Fernanda Malato Praxedes
Home Institution: Faculdade de Engenharia (FEG). Universidade Estadual Paulista (UNESP). Campus de Guaratinguetá. Guaratinguetá , SP, Brazil
Associated research grant:13/07296-2 - CDMF - Center for the Development of Functional Materials, AP.CEPID

Abstract

Much effort has been focused to studying the use of CaCu3Ti4O12 (CCTO) combined with other oxides for the manufacture of advanced ceramic composites. Reduced graphene oxide (RGO) has a structure, which is rich in active sites and, thus, very reactive, making it possible to enhance the (di)electric properties presented by CCTO and allowing its application in photocatalysis and in the development of electronic devices. Therefore, the objective of this project is to prepare CCTO/ RGO advanced nanocomposites in the form of powder and pellets, and analyze the effects of the addition of RGO nanoparticles and the sintering method (conventional and by microwaves) in the (micro)structure, and in the optical and (di)electric behavior of the system. The structure of the nanocomposites will be studied using X-ray diffractometry (XRD), XANES/EXAFS, photoluminescent response (PL), Raman spectroscopy, ultraviolet visible spectroscopy (UV-vis) and photocatalytic tests on nanocomposites in the form of powder. In the ceramic nanocomposites in the form of pellets, sintered conventionally and assisted by microwave will be performed a comparative study on their (micro)structure, dielectric and non-ohmic properties. The structure of the nanocomposites in the form of pellets will be studied by XRD using the Rietveld refinement method, and the microstructure analyzed using Confocal Raman Electron Microscopy to analyze the CCTO and RGO interfaces. Current-voltage (I-V) will be performed to determine the main parameters for the non-ohmic properties (non-linear coefficient, breakdown electric field, leakage current, among others) and impedance spectroscopy (IS) measurements will be used in order to measure the parameters necessary to define the dielectric properties (dielectric permitivitty and dielectric loss).