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(Reference retrieved automatically from Web of Science through information on FAPESP grant and its corresponding number as mentioned in the publication by the authors.)

Energy-dependent dead-time correction in digital pulse processors applied to silicon drift detector's X-ray spectra

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Author(s):
Barros, Suelen F. [1] ; Vanin, Vito R. [1] ; Malafronte, Alexandre A. [1] ; Maidana, Nora L. [1] ; Martins, Marcos N. [1]
Total Authors: 5
Affiliation:
[1] Univ Sao Paulo, Inst Fis, Rua Matao 1371, BR-05508090 Sao Paulo, SP - Brazil
Total Affiliations: 1
Document type: Journal article
Source: JOURNAL OF SYNCHROTRON RADIATION; v. 25, n. 2, p. 484-495, MAR 2018.
Web of Science Citations: 1
Abstract

Dead-time effects in X-ray spectra taken with a digital pulse processor and a silicon drift detector were investigated when the number of events at the low-energy end of the spectrum was more than half of the total, at counting rates up to 56 kHz. It was found that dead-time losses in the spectra are energy dependent and an analytical correction for this effect, which takes into account pulse pile-up, is proposed. This and the usual models have been applied to experimental measurements, evaluating the dead-time fraction either from the calculations or using the value given by the detector acquisition system. The energy-dependent dead-time model proposed fits accurately the experimental energy spectra in the range of counting rates explored in this work. A selection chart of the simplest mathematical model able to correct the pulse-height distribution according to counting rate and energy spectrum characteristics is included. (AU)

FAPESP's process: 13/24803-5 - Measurement of the atomic alignment by electron impact from L x-rays angular distribution
Grantee:Suelen Fernandes de Barros
Support type: Scholarships in Brazil - Doctorate