Grazing incidence X-ray diffraction and atomic force microscopy analysis of BaBi2 Ta2 O9 thin films

Mastelaro‚ V.R.; Foschini‚ C.R.; Varela‚ J.A.

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(Reference retrieved automatically from Google Scholar through information on FAPESP grant and its corresponding number as mentioned in the publication by the authors.)

Grazing incidence X-ray diffraction and atomic force microscopy analysis of BaBi₂ Ta₂ O₉ thin films

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Author(s):	Mastelaro‚ V.R. ; Foschini‚ C.R. ; Varela‚ J.A. Total Authors: 3
Document type:	Journal article
Source:	Thin Solid Films; v. 415, n. 1, p. 57-63, 2002.

FAPESP's process:	00/01991-0 - Synthesis and Characterization of Ferroelectric Thin Films and Ceramics
Grantee:	José Arana Varela
Support Opportunities:	Research Projects - Thematic Grants

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