Busca avançada
Ano de início
Entree
(Referência obtida automaticamente do Web of Science, por meio da informação sobre o financiamento pela FAPESP e o número do processo correspondente, incluída na publicação pelos autores.)

Laser-induced breakdown spectroscopy (LIBS) combined with hyperspectral imaging for the evaluation of printed circuit board composition

Texto completo
Autor(es):
Carvalho, Rodrigo R. V. [1] ; Coelho, Jomarc A. O. [1] ; Santos, Jozemir M. [1] ; Aquino, Francisco W. B. [1] ; Carneiro, Renato L. [1] ; Pereira-Filho, Edenir R. [2]
Número total de Autores: 6
Afiliação do(s) autor(es):
[1] Univ Fed Sao Carlos UFSCar, DQ, GQA, BR-13565905 Sao Carlos, SP - Brazil
[2] Univ Fed Sao Carlos UFSCar, GAIA, DQ, BR-13565905 Sao Carlos, SP - Brazil
Número total de Afiliações: 2
Tipo de documento: Artigo Científico
Fonte: Talanta; v. 134, p. 278-283, MAR 1 2015.
Citações Web of Science: 25
Resumo

In this study, laser-induced breakdown spectroscopy (LIBS) was combined with chemometric strategies (PCA, Principal Component Analysis) and scanning electron microscopy with energy-dispersive X-ray spectroscopy (SEM-EDS) to investigate the metal composition of a printed circuit board (PCB) sample from a mobile phone. Scanning electron microscopy-EDS was used for two main reasons: it was possible at the same time to visualize the sample surface, craters (made by the laser pulses) and also the chemical composition of the samples. A 30 mm x 40 mm area of the mobile phone PCB sample, which was manufactured in 2011, was investigated. In this case, a matrix with 30 rows and 40 columns (1200 points) was analyzed, and 10 pulses were performed at each point. A total of 12,000 emission spectra were recorded in the wavelength range from 186 to 1040 nm. After an initial exploratory investigation using PCA, 18 emission lines were selected (representing the elements Al, Au, Ba, Ca, Co, Cu, Fe, K, Li, Mg, Mn, Na, Ni, Sb, Si, Sn, Ti and Zn) and then normalized by the relative intensities, and a new PCA was calculated with the autoscaled data. For example, Au and Si were mainly observed in the superficial electrical contacts and in the bulk of the PCB, respectively. A second sample (a mouse PCB) was also analyzed and Pb (emission lines 357.273, 363.956, 368346, 373.994 and 405.780 nm) was identified in the solders. In addition, this element was determined using FAAS (flame atomic absorption spectrometry) and the Pb concentration was around 25% (w/w). This study opens the possibility for improved recycling processes and the chemical investigation of solid samples measuring a few millimeters in dimension without sample preparation. (C) 2014 Elsevier B.V. All rights reserved. (AU)

Processo FAPESP: 12/50827-6 - Readequação física dos laboratórios do grupo de análise instrumental aplicada (Gaia) para a proposição de métodos analíticos de análise de lixo eletrônico e de cosméticos
Beneficiário:Edenir Rodrigues Pereira Filho
Linha de fomento: Auxílio à Pesquisa - Regular
Processo FAPESP: 12/01769-3 - Desenvolvimento de métodos espectroanalíticos para a análise direta de amostras de lixo eletrônico e de cosméticos
Beneficiário:Edenir Rodrigues Pereira Filho
Linha de fomento: Auxílio à Pesquisa - Regular
Processo FAPESP: 13/04688-7 - Desenvolvimento de métodos espectroanalíticos para a determinação direta de elementos tóxicos em materiais poliméricos de lixo eletrônico por emissão em plasma induzido por laser (LIBS)
Beneficiário:Francisco Wendel Batista de Aquino
Linha de fomento: Bolsas no Brasil - Pós-Doutorado