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(Referência obtida automaticamente do SciELO, por meio da informação sobre o financiamento pela FAPESP e o número do processo correspondente, incluída na publicação pelos autores.)

The use of atomic force microscopy as an important technique to analyze the dispersion of nanometric fillers and morphology in nanocomposites and polymer blends based on elastomers

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Autor(es):
Fabiula Danielli Bastos de Sousa ; Carlos Henrique Scuracchio
Número total de Autores: 2
Tipo de documento: Artigo Científico
Fonte: POLIMEROS-CIENCIA E TECNOLOGIA; v. 24, n. 6, p. 661-672, Dez. 2014.
Resumo

AFM has been recognized as one of the most powerful tools for the analysis of surface morphologies because it creates three-dimensional images at angstrom and nano scale. This technique has been exhaustively used in the analyses of dispersion of nanometric components in nanocomposites and in polymer blends, because of the easiness of sample preparation and lower equipment maintenance costs compared to electron microscopy. In this review, contributions using AFM are described, with emphasis on the dispersion of nanofillers in polymeric matrices. It is aimed to show the importance of technical analysis for nanocomposites and polymer blends based on elastomers. (AU)

Processo FAPESP: 10/15799-6 - Estudo e caracterização de blendas de nanocompósitos com borrachas recicladas
Beneficiário:Carlos Henrique Scuracchio
Linha de fomento: Auxílio à Pesquisa - Regular