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(Referência obtida automaticamente do SciELO, por meio da informação sobre o financiamento pela FAPESP e o número do processo correspondente, incluída na publicação pelos autores.)

Structural characterization and ferroelectric properties of strontium barium niobate (Sr xBa1-xNb2O6) thin films

Texto completo
Autor(es):
R.G. Mendes ; E.B. Araújo ; J.A. Eiras
Número total de Autores: 3
Tipo de documento: Artigo Científico
Fonte: MATERIALS RESEARCH-IBERO-AMERICAN JOURNAL OF MATERIALS; v. 4, n. 2, p. 113-116, 2001.
Resumo

Strontium barium niobate (SBN) thin films of good quality were deposited on Pt/Ti/SiO2/Si substrate using a polymeric resin containing metallic ions. Films were crystallized at different temperatures and for different duration of time. The structure of these films was studied using X-ray diffraction. The coexistence of SrNb2O6 (SN) and SBN was observed in films crystallized at 700 °C. The amount of SN decreases when the crystallization time increases. Ferroelectric properties were determined for films crystallized at 700 °C for 1 and 5 h. For SBN film crystallized at 700 °C for 1 h, the remanent polarization (Pr) and the coercive field (Ec) were 2.6 muC/cm² and 71.9 kV/cm, respectively. For the film crystallized at 700 °C for 5 h these parameters were Pr = 1.1 muC/cm² and Ec = 50.5 kV/cm. (AU)

Processo FAPESP: 99/02485-2 - Síntese, deposição e caracterização dielétrica e ferroelétrica de filmes finos
Beneficiário:Eudes Borges de Araújo
Linha de fomento: Bolsas no Brasil - Pós-Doutorado