Controlling the Electronic, Structural, and Optical Properties of Novel MgTiO3/LaNiO3 Nanostructured Films for Enhanced Optoelectronic Devices

Autor(es):Mostrar menos -

Mazzo, T. M. ^[1] ; Macario, L. R. ^[2] ; Gorup, L. F. ^[3] ; Bouquet, V ^[4] ; Deputier, S. ^[4] ; Ollivier, S. ^[4] ; Guilloux-Viry, M. ^[4] ; Albuquerque, A. R. ^[5] ; Sambrano, J. R. ^[6] ; La Porta, F. A. ^[7] ; Longo, E. ^[2]

Afiliação do(s) autor(es)

^[1] Fed Univ Sao Paulo UNIFESP, Inst Marine Sci, POB 11070-100, BR-11015020 Santos, SP - Brazil

^[2] Univ Fed Sao Carlos UFSCar, CDMF, INCTMN, Rod Washington Luis Km 235, CP 676, BR-13565905 Sao Carlos, SP - Brazil

^[3] Fed Univ Grande Dourados, Dept Chem, FACET, BR-79804970 Dourados, MS - Brazil

^[4] Univ Rennes, UMR 6226, CNRS, Inst Sci Chim Rennes, Campus Beaulieu, F-35042 Rennes - France

^[5] Univ Fed Rio Grande do Norte UFRN, Inst Quim, BR-59078970 Natal, RN - Brazil

^[6] Sao Paulo State Univ UNESP, Modeling & Mol Simulat Grp, BR-17033360 Bauru, SP - Brazil

^[7] Fed Technol Univ Parana UTFPR, Lab Nanotechnol & Computat Chem, BR-86036370 Londrina, Parana - Brazil

• Tipo de documento: Artigo Científico
• Fonte: ACS APPLIED NANO MATERIALS; v. 2, n. 5, p. 2612-2620, MAY 2019.
• Citações Web of Science: 0

Resumo

This study systematically investigated the electronic, structural, and optical properties of MgTiO3 (MTO), LaNiO3 (LNO), and MgTiO3/LaNiO3 (MTO/LNO) nanostructured films grown on Si(100) substrates by the pulsed laser deposition method. The structural characterizations obtained by X-ray diffraction revealed a preferred (003) orientation for the MTO film, while the LNO film was polycrystalline. The diffraction peaks corresponded to a rhombohedral structure, which was confirmed by micro-Raman spectroscopy for both nanostructured films. The MTO/LNO heterostructure was polycrystalline and exhibited the diffraction peaks of both the MTO and the LNO phases. Additionally, the results revealed that the LNO films did not have a significant photoluminescence (PL) emission, while an intense broad infrared luminescence centered at 724 nm appeared for the MTO nanostructured film. Surprisingly, for the MTO/LNO heterostructure, the PL emission profile exhibited a dual-color emission with an intense broad luminescence in the blue region (maximum centered at 454 nm) and an intense near-infrared emission (maximum centered at 754 nm), respectively, mainly because of the effect of interface defects, which induced a significant change in the PL behavior. Therefore, our experimental results correlated with the theoretical simulations based on the periodic density functional theory formalism and contributed to a deeper understanding of the charge/energy transfer processes occurring in the MTO/LNO/Si interfaces, and toward the exploitation of the close relationship between the structure and properties of these new functional materials. (AU)

• Processo FAPESP: 13/07296-2 - CDMF - Centro de Desenvolvimento de Materiais Funcionais
• Beneficiário: Elson Longo da Silva
• Modalidade de apoio: Auxílio à Pesquisa - Centros de Pesquisa, Inovação e Difusão - CEPIDs