| Texto completo | |
| Autor(es): |
Rocha, L. S. R.
;
Cavalcanti, C. S.
;
Amoresi, R. A. C.
;
Stojanovic, B. D.
;
Borsari, E.
;
Zaghete, M. A.
;
Simoes, A. Z.
Número total de Autores: 7
|
| Tipo de documento: | Artigo Científico |
| Fonte: | MATERIALS CHARACTERIZATION; v. 120, p. 6-pg., 2016-10-01. |
| Resumo | |
Atomic Force Acoustic Microscopy (AFAM) and Piezoresponse Force Microscopy (PFM) were used to study local elastic and electromechanical response in BaTiO3 ceramics. A commercial multi-mode Scanning Probe Microscopy (SPM) and AFAM mode to image contact stiffness were employed to accomplish the aforementioned purposes. Stiffness parameters along with Young's moduli and piezo coefficients were quantitatively determined. PFM studies were based on electrostatic and electromechanical response from localized tip-surface contact. Comparison was made regarding the Young's moduli obtained by AFAM and PFM. In addition, phase and amplitude images were analyzed based on poling behavior, obtained via the application of -10 V to +10 V local voltage. (C) 2016 Elsevier Inc. All rights reserved. (AU) | |
| Processo FAPESP: | 08/57872-1 - Instituto Nacional de Ciências dos Materiais em Nanotecnologia |
| Beneficiário: | Elson Longo da Silva |
| Modalidade de apoio: | Auxílio à Pesquisa - Temático |
| Processo FAPESP: | 13/07296-2 - CDMF - Centro de Desenvolvimento de Materiais Funcionais |
| Beneficiário: | Elson Longo da Silva |
| Modalidade de apoio: | Auxílio à Pesquisa - Centros de Pesquisa, Inovação e Difusão - CEPIDs |