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Energy-dependent dead-time correction in digital pulse processors applied to silicon drift detector's X-ray spectra

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Autor(es):
Barros, Suelen F. ; Vanin, Vito R. ; Malafronte, Alexandre A. ; Maidana, Nora L. ; Martins, Marcos N.
Número total de Autores: 5
Tipo de documento: Artigo Científico
Fonte: JOURNAL OF SYNCHROTRON RADIATION; v. 25, p. 12-pg., 2018-03-01.
Resumo

Dead-time effects in X-ray spectra taken with a digital pulse processor and a silicon drift detector were investigated when the number of events at the low-energy end of the spectrum was more than half of the total, at counting rates up to 56 kHz. It was found that dead-time losses in the spectra are energy dependent and an analytical correction for this effect, which takes into account pulse pile-up, is proposed. This and the usual models have been applied to experimental measurements, evaluating the dead-time fraction either from the calculations or using the value given by the detector acquisition system. The energy-dependent dead-time model proposed fits accurately the experimental energy spectra in the range of counting rates explored in this work. A selection chart of the simplest mathematical model able to correct the pulse-height distribution according to counting rate and energy spectrum characteristics is included. (AU)

Processo FAPESP: 13/24803-5 - Medida do alinhamento atômico por impacto de elétrons pela distribuição angular de raios x L
Beneficiário:Suelen Fernandes de Barros
Modalidade de apoio: Bolsas no Brasil - Doutorado