| Texto completo | |
| Autor(es): |
Zanatta, A. R.
;
Oliveira Jr, M. H.
;
Marques, F. C.
Número total de Autores: 3
|
| Tipo de documento: | Artigo Científico |
| Fonte: | Materials Chemistry and Physics; v. 319, p. 6-pg., 2024-04-18. |
| Resumo | |
The stability of carbon-based films is greatly influenced by their intrinsic stress and by the film-substrate interaction that, in certain cases, can induce the formation of micrometer-sized patterns. The study of these patterns (henceforth, C-serpentines) provides important information regarding the mechanical properties of C films and, hence, has motivated several investigations. However, most of these efforts originate from microscope based techniques in which the bond structure details of the C-serpentines are not taken into account. The importance of C-films in practical applications and the absence of Raman spectroscopy studies about C-serpentines form the basis of this paper. Accordingly, this work presents a thorough investigation of a C-film (as deposited by ion-beam deposition) onto the C-serpentine and nearby, as obtained by Raman scattering spectroscopy. Based on the experimental results it is possible to state that, contrary to the C-film (that is made of very small graphite crystallites), the regions occupied by the C-serpentine correspond to larger crystallites (typically >= 100 nm). Also, the results show that the C-serpentine is less stressed, which is in agreement with its crystallite size as well as with the accepted models that explain the C-serpentine formation. (AU) | |
| Processo FAPESP: | 17/11986-5 - Geração e Armazenamento de Novas Energias: trazendo desenvolvimento tecnológico para o país |
| Beneficiário: | Ana Flávia Nogueira |
| Modalidade de apoio: | Auxílio à Pesquisa - Programa Centros de Pesquisa em Engenharia |