Effects of a Peripheral Enamel Margin on the Long-term Bond Strength and Nanoleakage of Composite/Dentin Interfaces Produced by Self-adhesive and Conventional Resin Cements

Autor(es)

Kasaz, Alline C. ^[1] ; Pena, Carlos E. ^[1] ; de Alexandre, Rodrigo S. ^[1] ; Viotti, Ronaldo G. ^{[1, 2]} ; Santana, Veronica B. ^[1] ; Arrais, Cesar A. G. ^[1] ; Giannini, Marcelo ^[3] ; Reis, Andre F. ^[1]

Afiliação do(s) autor(es)

^[1] Univ Guarulhos, Dept Restorat Dent, BR-07023070 Guarulhos, SP - Brazil

^[2] Blumenau Reg Univ, Blumenau, SC - Brazil

^[3] Univ Estadual Campinas, Piracicaba Sch Dent, Dept Restorat Dent, Piracicaba, SP - Brazil

• Tipo de documento: Artigo Científico
• Fonte: Journal of Adhesive Dentistry; v. 14, n. 3, p. 251-263, JUN 2012.
• Citações Web of Science: 17

Resumo

Purpose: This study evaluated the effects of peripheral enamel margins on the long-term bond strength (mu TBS) and nanoleakage in resin/dentin interfaces produced by self-adhesive and conventional resin cements. Materials and Methods: Five self-adhesive {[}RelyX-Unicem (UN), RelyX-U100 (UC), GCem (GC), Maxcem (MC), Set (SET)] and 2 conventional resin cements {[}RelyX-ARC(RX), Panavia F(PF)] were used. An additional group included the use of a two-step self-etching adhesive (SE Bond) with Panavia F (PS). One hundred ninety-two molars were assigned to 8 groups according to luting material. Five-mm-thick composite disks were cemented and assigned to 3 subgroups according to water-exposure condition (n = 6): 24-h peripheral exposure (24h-PE-enamel margins), or 1 year of peripheral (1yr-PE) or direct exposure (1yr-DE-dentin margin). Restored teeth were sectioned into beams and tested in tension at 1 mm/min. Data were analyzed by two-way ANOVA and Tukey's test. Two additional specimens in each group were prepared for nanoleakage evaluation. Nanoleakage patterns were observed under SEM/TEM. Results: Except for RX, no significant reduction in mu TBS was observed between 24h-PE and 1yr-PE. 1yr-DE reduced mu TBS for RX, PF, GC, MC, and SET. No significant reduction in mu TBS was observed for PS, UC, and UN after 1 year. After 1yr-DE, RX and PS presented the highest mu TBS, and SET and MC the lowest. Nanoleakage was reduced when there was a peripheral enamel margin. SET and MC presented more silver deposition than other groups. Conclusion: The presence of a peripheral enamel margin reduced the degradation rate in resin/dentin interfaces for most materials. The mu TBS values produced by the multi-step luting agents RX and PS were significantly higher than those observed for self-adhesive cement (AU)

• Processo FAPESP: 07/06083-4 - Análise da resistência de união, nanoinfiltração e características ultramorfológicas das interfaces de união resina-dentina produzidas por cimentos auto-adesivos ao longo do tempo
• Beneficiário: André Figueiredo Reis
• Modalidade de apoio: Auxílio à Pesquisa - Regular
• Processo FAPESP: 07/06447-6 - Análise da resistência de união, nanoinfiltração e características ultramorfológicas das interfaces de união resina-dentina produzidas por cimentos auto-adesivos ao longo do tempo
• Beneficiário: Alline de Cerqueira Kasaz
• Modalidade de apoio: Bolsas no Brasil - Mestrado