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(Referência obtida automaticamente do Web of Science, por meio da informação sobre o financiamento pela FAPESP e o número do processo correspondente, incluída na publicação pelos autores.)

Development of a quartz tuning-fork-based force sensor for measurements in the tens of nanoNewton force range during nanomanipulation experiments

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Autor(es):
Oiko, V. T. A. [1] ; Martins, B. V. C. [2] ; Silva, P. C. [3] ; Rodrigues, V. [1] ; Ugarte, D. [1]
Número total de Autores: 5
Afiliação do(s) autor(es):
[1] Univ Estadual Campinas UNICAMP, Inst Fis Gleb Wataghin, BR-13083859 Campinas, SP - Brazil
[2] Univ Alberta, Dept Phys, Edmonton, AB T6G 2R3 - Canada
[3] CNPEM, Lab Nacl Nanotecnol, BR-13083970 Campinas, SP - Brazil
Número total de Afiliações: 3
Tipo de documento: Artigo Científico
Fonte: Review of Scientific Instruments; v. 85, n. 3 MAR 2014.
Citações Web of Science: 5
Resumo

Understanding the mechanical properties of nanoscale systems requires new experimental and theoretical tools. In particular, force sensors compatible with nanomechanical testing experiments and with sensitivity in the nN range are required. Here, we report the development and testing of a tuning-fork-based force sensor for in situ nanomanipulation experiments inside a scanning electron microscope. The sensor uses a very simple design for the electronics and it allows the direct and quantitative force measurement in the 1-100 nN force range. The sensor response is initially calibrated against a nN range force standard, as, for example, a calibrated Atomic Force Microscopy cantilever; subsequently, applied force values can be directly derived using only the electric signals generated by the tuning fork. Using a homemade nanomanipulator, the quantitative force sensor has been used to analyze the mechanical deformation of multi-walled carbon nanotube bundles, where we analyzed forces in the 5-40 nN range, measured with an error bar of a few nN. (C) 2014 AIP Publishing LLC. (AU)

Processo FAPESP: 10/51028-4 - Estudos de nanomanipulacao e caracterizacao de nano-objetos individuais por experimentos in situ de microscopia eletronica.
Beneficiário:Vitor Toshiyuki Abrão Oiko
Modalidade de apoio: Bolsas no Brasil - Doutorado