Nonlinear ellipse rotation measurements in optical thick samples

Autor(es)

Miguez, M. L. ^[1] ; Barbano, E. C. ^[1] ; Coura, J. A. ^[1] ; Zilio, S. C. ^[1] ; Misoguti, L. ^[1]

Afiliação do(s) autor(es)

^[1] Univ Sao Paulo, Inst Fis Sao Carlos, BR-13560970 Sao Carlos, SP - Brazil

• Tipo de documento: Artigo Científico
• Fonte: APPLIED PHYSICS B-LASERS AND OPTICS; v. 120, n. 4, p. 653-658, SEP 2015.
• Citações Web of Science: 9

Resumo

Nonlinear refractive indices of several optical glasses were measured by means of the nonlinear ellipse rotation method in a tightly focused laser beam condition, leading to the improvement of the spatial resolution which allows probing the local refractive nonlinearity with better accuracy. The use of a short focal length results in a Rayleigh range shorter than the sample thickness, and this feature can be explored to measure two stacked samples in a single run. In this way, it is possible to simultaneously probe a reference and an unknown sample, improving significantly the refractive nonlinearity determination. Several optical glasses were characterized by this method using fused silica as reference. (AU)

• Processo FAPESP: 13/11514-5 - Estudo da rotação não linear da polarização elíptica: influência da origem da não linearidade refrativa
• Beneficiário: Maria Luiza Miguez
• Modalidade de apoio: Bolsas no Brasil - Doutorado