In situ X-ray diffraction studies on the piezoelectric response of PZT thin films

Autor(es)

Davydok, A. ^{[1, 2]} ; Cornelius, T. W. ^[1] ; Mocuta, C. ^[3] ; Lima, E. C. ^[4] ; Araujo, E. B. ^[5] ; Thomas, O. ^[1]

Afiliação do(s) autor(es)

^[1] Univ Toulon & Var, Aix Marseille Univ, CNRS, IM2NP UMR 7334, F-13397 Marseille - France

^[2] Max Planck Inst Eisenforsch GmbH, Dept Struct & Nanomicromech Mat, D-40237 Dusseldorf - Germany

^[3] SOLEIL Synchrotron, DiffAbs Beamline Orme Merisiers, St Aubin BP 48, Y-91192 Gif Sur Yvette - France

^[4] Univ Fed Tocantins, BR-77500000 Porto Nacl, TO - Brazil

^[5] Univ Estadual Paulista, Dept Quim & Fis, Av Brasil, 56 Ctr, BR-15385000 Ilha Solteira, SP - Brazil

• Tipo de documento: Artigo Científico
• Fonte: Thin Solid Films; v. 603, p. 29-33, MAR 31 2016.
• Citações Web of Science: 4

Resumo

Piezoelectric properties of randomly oriented self-polarized PbZr0.50Ti0.50O3 (PZT) thin films were investigated using in situ synchrotron X-ray diffraction. Possibilities for investigating the piezoelectric effect using microsized hard X-ray beams are demonstrated and perspectives for future dynamical measurements on PZT samples with variety of compositions and thicknesses are given. Studies performed on the crystalline {[}100, 110] directions evidenced piezoelectric anisotropy. The piezoelectric coefficient d(33) was calculated in terms of the lab reference frame (d(perp)) and found to be two times larger along the {[}100] direction than along the {[}110] direction. The absolute values for the d(perp) amount to 120 and 230 pm/V being in good agreement with experimental and theoretical values found in literature for bulk PZT ceramics. (C) 2016 Elsevier B.V. All rights reserved. (AU)

• Processo FAPESP: 10/16504-0 - Influência de fatores extrínsecos sobre as propriedades de filmes ultrafinos de PZT
• Beneficiário: Eudes Borges de Araújo
• Modalidade de apoio: Auxílio à Pesquisa - Regular