Nanoindentation unidirectional sliding and lateral force microscopy: Evaluation of experimental techniques to measure friction at the nanoscale

Autor(es)

Echeverrigaray, F. G. ^[1] ; Sales de Mello, S. R. ^[1] ; Boeira, C. D. ^[1] ; Leidens, L. M. ^[1] ; Maia da Costa, M. E. H. ^[2] ; Freire, Jr., F. L. ^[2] ; Alvarez, F. ^[3] ; Michels, A. F. ^[1] ; Figueroa, C. A. ^{[1, 4]}

Afiliação do(s) autor(es)

^[1] Univ Caxias do Sul, PPGMAT, BR-95070560 Caxias Do Sul - Brazil

^[2] Pontificia Univ Catolica Rio de Janeiro, Dept Fis, BR-22453900 Rio De Janeiro, RJ - Brazil

^[3] Univ Estadual Campinas, Inst Fis Gleb Wataghin, BR-13081970 Campinas, SP - Brazil

^[4] Plasmar Tecnol Ltd, BR-95030775 Caxias Do Sul - Brazil

• Tipo de documento: Artigo Científico
• Fonte: AIP ADVANCES; v. 8, n. 12 DEC 2018.
• Citações Web of Science: 0

Resumo

Lateral force microscopy (LFM) is an established technique to assess friction forces at the nanoscale. Nanoindentation followed by unidirectional sliding (NUS) is also used to evaluate friction forces at the micro/nanoscale. However, comparative studies between NUS and LFM evaluating the experimental results at different scales are still missing. In this work, a-C:D/H and a-C:H thin films with different {[}D]/{[}C] and {[}H]/{[}C] contents were used to analyze the friction forces by NUS and LFM. The results show that the friction behavior assessed by these two techniques in different scales is the same. The correlation between friction forces measured by NUS and LFM depends mainly on a contact area factor that makes invariant the friction force from nanoscale to microscale. Such behavior suggests a similar damping mechanism, probably phonon-coupling phenomena, for the friction force origin. (C) 2018 Author(s). (AU)

• Processo FAPESP: 12/10127-5 - Pesquisa e desenvolvimento de materiais nanoestruturados para aplicações eletrônicas e de física de superfícies
• Beneficiário: Fernando Alvarez
• Modalidade de apoio: Auxílio à Pesquisa - Temático