Surface structure characterization by X-ray photoelectron diffraction of Sn ultra-thin films deposited on Pd(111)

Autor(es)

Pancotti, A. ^[1] ; de Siervo, A. ^[2] ; Carazzolle, M. F. ^[3] ; Silva, J. J. ^[1] ; Nascente, P. A. P. ^[4] ; Landers, R. ^[2]

Afiliação do(s) autor(es)

^[1] Univ Fed Jatai, Unidade Acad Especial Ciencias Exatas & Tecnol, Curso Fis, BR-75801615 Jatai, Go - Brazil

^[2] Univ Estadual Campinas, Inst Fis Gleb Wataghin, Dept Fis Aplicada, BR-13083970 Campinas, SP - Brazil

^[3] Univ Estadual Campinas, Inst Biol, Dept Genet Evolucao Microbiol & Imunol, BR-13083859 Campinas, SP - Brazil

^[4] Univ Fed Sao Carlos, Dept Engn Mat, BR-13565905 Sao Carlos, SP - Brazil

• Tipo de documento: Artigo Científico
• Fonte: Surface Science; v. 685, p. 7-12, JUL 2019.
• Citações Web of Science: 2

Resumo

The formation of surface alloys obtained by annealing ultra-thin films of Sn deposited on a Pd(111) surface was characterized by X-ray photoelectron spectroscopy (XPS), low-energy electron diffraction (LEED), and X-ray photoelectron diffraction (XPD). Annealing the surface at 600 K produced a (root 3x root 3)R30 degrees LEED pattern, and the comparison between experimental and theoretical XPD results indicated the formation of a corrugated bi-dimensional Pd2Sn surface alloy, with Sn atoms being present not only on the outmost layer but also at least on the second internal layer. (AU)

• Processo FAPESP: 17/25983-8 - Revestimentos de Titânio, Nióbio e suas Ligas sobre Aço Inoxidável AISI 316L e Titânio
• Beneficiário: Pedro Augusto de Paula Nascente
• Modalidade de apoio: Auxílio à Pesquisa - Regular