A thermal method for obtention of 2 to 3 reduced graphene oxide layers from graphene oxide

Autor(es)

Silva Filho, J. C. ^[1] ; Venancio, E. C. ^[1] ; Silva, S. C. ^[2] ; Takiishi, H. ^[2] ; Martinez, L. G. ^[2] ; Antunes, R. A. ^[1]

Afiliação do(s) autor(es)

^[1] Fed Univ ABC, Santo Andre, SP - Brazil

^[2] Nucl & Energy Res Inst, Mat Sci & Technol Ctr, Sao Paulo - Brazil

• Tipo de documento: Artigo Científico
• Fonte: SN APPLIED SCIENCES; v. 2, n. 8 JUL 29 2020.
• Citações Web of Science: 0

Resumo

In this work, a thermal reduction method was developed to obtain reduced graphene oxide (rGO) with 2 or 3 layers from graphene oxide (GO). The GO X-ray diffraction (XRD) patterns presented diffraction peak at 2 theta = 10 degrees, which is related to (002) reflection. After heat treatment under nitrogen (N-2(g)) atmosphere, this peak was shifted to 2 theta = 25 degrees, presenting an interlayer distance of 3.8 angstrom, associated to GO reduction. BET analysis of modified GO samples identified an average pore diameter of 45.38 angstrom and surface area of 23.06 m(2)/g. In the case of rGO(1), rGO(2) and rGO(3) samples, they presented surface areas from 32.47 to 612.74 m(2)/g and an average pore diameter of 108.21-149.54 m(2)/g. Thermogravimetric analysis (TGA) indicated a higher mass loss between 150 and 230 degrees C. Raman spectra showed ID/IG ratios of rGO samples were higher than GO (1.36-GO; 1.45-rGO(1), 1.87-rGO(3)) due to reducing GO and increasing sp(2) clusters. XPS analysis revealed that the main carbon species in the samples were sp(2)-type bonds (14.99 at% for the GO and 47.85 at% for rGO(3)). The FTIR spectra of rGO(1), rGO(2) and rGO(3) samples presented peaks at 3454.22 cm(-1) (hydroxyl) and 1077.43 cm(-1) (C-O). (AU)

• Processo FAPESP: 14/50887-4 - INCT 2014: PATRIA Processamento e Aplicação de Ímãs de Terras Raras para Indústria de Alta Tecnologia
• Beneficiário: Fernando Jose Gomes Landgraf
• Modalidade de apoio: Auxílio à Pesquisa - Temático