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(Referência obtida automaticamente do Web of Science, por meio da informação sobre o financiamento pela FAPESP e o número do processo correspondente, incluída na publicação pelos autores.)

ime-resolved piezoelectric response in relaxor ferroelectric (Pb0.88La0.12)(Zr0.52Ti0.48)O-3 thin film

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Autor(es):
Roessle, Matthias [1] ; Thomas, Olivier [2] ; Mocuta, Cristian [3] ; Rousset, Raphael [2] ; Texier, Michael [2] ; Escoubas, Stephanie [2] ; Dubourdieu, Catherine [4, 5] ; Araujo, Eudes B. [6] ; Cornelius, Thomas W. [2]
Número total de Autores: 9
Afiliação do(s) autor(es):
[1] Helmholtz Zentrum Berlin Mat & Energie GmbH, Wilhelm Conrad Rontgen Campus, BESSY II, D-12489 Berlin - Germany
[2] Aix Marseille Univ, Univ Toulon, CNRS, IM2NP UMR 7334, Marseille - France
[3] Synchrotron SOLEIL, Lorme Merisiers, St Aubin BP 48, F-91192 Gif Sur Yvette - France
[4] Helmholtz Zentrum Berlin Mat & Energie GmbH, Inst Funct Oxides Energy Efficient Informat Techn, Hahn Meitner Platz 1, D-14109 Berlin - Germany
[5] Free Univ Berlin, Phys Chem, Arnimallee 22, D-14195 Berlin - Germany
[6] Sao Paulo State Univ UNESP, Dept Phys & Chem, Sch Nat Sci & Engn, BR-15385000 Ilha Solteira, SP - Brazil
Número total de Afiliações: 6
Tipo de documento: Artigo Científico
Fonte: Journal of Applied Physics; v. 131, n. 6 FEB 14 2022.
Citações Web of Science: 0
Resumo

The domain switching dynamics in a relaxor ferroelectric lanthanum-modified lead zirconate titanate thin film with 12 mol. % La was investigated by time-resolved x-ray diffraction. While most frequently epitaxial thin films are investigated, the present work reports results on a polycrystalline thin film. Asymmetric butterfly loops of the strain as a function of the applied electric field evidenced a built-in electric field oriented toward the thin film-substrate interface. The piezoelectric coefficient d(33) (in the film reference frame) diminishes with the increasing frequency of an applied AC electric field. From the strain transient during the application of positive-up negative-down voltage pulse sequences with frequencies of up to 100 kHz, characteristic times of the order of 100-200 ns were determined for these relaxor ferroelectric thin films. While switching times ranging from the picosecond to the millisecond range are reported in the literature for different materials, these characteristic switching times are comparable to epitaxial lead zirconate titanate thin films of various compositions despite the polycrystallinity of the present thin film. However, the evidenced built-in electric field significantly influences the switching behavior for different polarities. (AU)

Processo FAPESP: 17/13769-1 - Materiais multiferróicos e ferroelétricos para conversores de energia: síntese, propriedades, fenomenologia e aplicações
Beneficiário:José Antonio Eiras
Modalidade de apoio: Auxílio à Pesquisa - Temático