Method to obtain nonuniformity information from field emission behavior

Autor(es)

Dall'Agnol, Fernando F. ; de Paulo, Alexandre C. ; Paredez, Pablo ; den Engelsen, Daniel ; Santos, Thebano E. A. ; Mammana, Victor P.

• Tipo de documento: Artigo Científico
• Fonte: JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B; v. 28, n. 3, p. 9-pg., 2010-05-01.

Resumo

This article describes the characterization of field emission from a planar cathode to a spherical anode with the approach curve method (ACM). In such a diode configuration the electric field strength at the cathode surface is nonuniform. This nonuniformity gives an extra degree of freedom and it allows the interpretation of the current-voltage and voltage-distance (Vxd) curves in terms of nonuniformity. The authors apply the ACM to Cu emitters to explain the nonlinearity of the Vxd curve in ACM measurements. This analysis provides a good insight into field emission phenomena, supporting a method for nonuniformity characterization based on field emission behavior. (C) 2010 American Vacuum Society. [DOI: 10.1116/1.3327928] (AU)

• Processo FAPESP: 07/55101-5 - Daniel Den Engelsen | N/C - Holanda
• Beneficiário: Victor Pellegrini Mammana
• Modalidade de apoio: Auxílio à Pesquisa - Pesquisador Visitante - Internacional