| Texto completo | |
| Autor(es): |
Lima, E. C.
;
Araujo, E. B.
;
Bdikin, I. K.
;
Kholkin, A. L.
Número total de Autores: 4
|
| Tipo de documento: | Artigo Científico |
| Fonte: | Ferroelectrics; v. 465, n. 1, p. 9-pg., 2014-06-11. |
| Resumo | |
PbZr1-xTixO3 (PZT) thin films (x = 0.46, 0.47, 0.48, 0.49, and 0.50) were deposited on Pt/TiO2/SiO2/Si substrates using a polymeric chemical method to study the effects of the composition on the macroscopic electrical and local piezoelectric properties. Both measurements demonstrate the existence of a self-polarization effect in all studied PZT films. The measurements were discussed in terms of the contribution of the Schottky barriers to the self-polarization effect. It is shown that both Schottky barrier effect and mechanical coupling near the film-substrate interface are not the dominant mechanisms responsible for the observed phenomena. (AU) | |
| Processo FAPESP: | 07/08534-3 - Síntese e caracterização de filmes ultrafinos de PZT |
| Beneficiário: | Elton Carvalho de Lima |
| Modalidade de apoio: | Bolsas no Brasil - Doutorado |
| Processo FAPESP: | 13/12642-7 - 13th International Meeting on Ferroelectricity |
| Beneficiário: | Eudes Borges de Araújo |
| Modalidade de apoio: | Auxílio à Pesquisa - Reunião - Exterior |
| Processo FAPESP: | 10/16504-0 - Influência de fatores extrínsecos sobre as propriedades de filmes ultrafinos de PZT |
| Beneficiário: | Eudes Borges de Araújo |
| Modalidade de apoio: | Auxílio à Pesquisa - Regular |