Preventing Chaotic Motion in Tapping-Mode Atomic Force Microscope

Autor(es)

Rodrigues, Kleber dos Santos ; Balthazar, Jose Manoel ; Tusset, Angelo Marcelo ; de Pontes, Bento Rodrigues, Jr. ; Bueno, Atila Madureira

• Tipo de documento: Artigo Científico
• Fonte: JOURNAL OF CONTROL AUTOMATION AND ELECTRICAL SYSTEMS; v. 25, n. 6, p. 9-pg., 2014-12-01.

Resumo

During the last 30 years the Atomic Force Microscopy became the most powerful tool for surface probing in atomic scale. The Tapping-Mode Atomic Force Micro-scope is used to generate high quality accurate images of the samples surface. However, in this mode of operation the microcantilever frequently presents chaotic motion due to the nonlinear characteristics of the tip-sample forces interactions, degrading the image quality. This kind of irregular motion must be avoided by the control system. In this work, the tip-sample interaction is modelled considering the Lennard-Jones potentials and the two-term Galerkin aprox-imation. Additionally, the State Dependent Ricatti Equation and Time-Delayed Feedback Control techniques are used in order to force the Tapping-Mode Atomic Force Microscope system motion to a periodic orbit, preventing the microcantilever chaotic motion. (AU)

• Processo FAPESP: 13/04101-6 - Sincronismo de osciladores e suas aplicações em ciência da engenharia
• Beneficiário: Atila Madureira Bueno
• Modalidade de apoio: Auxílio à Pesquisa - Regular