Role of residual stress on phase transformations of Pb(Zr0.50Ti0.50)O-3 thin films obtained from chemical route

Autor(es)

Lima, E. C. ; Araujo, E. B.

• Tipo de documento: Artigo Científico
• Fonte: Ferroelectrics; v. 499, n. 1, p. 8-pg., 2016-01-01.

Resumo

The effects of heat treatment on the phase transformations of lead zirconate titanate Pb(Zr0.50Ti0.50)O-3 (PZT) thin films were studied. The pyrolysis temperature directly affected the densification, residual stresses, and suppression of the pyrochlore phase observed in the studied films. The evolution of the crystalline phases and the residual stress were characterized by different temperatures of pyrolysis in PZT thin films, using the X-ray diffraction technique. The phase transformations in the films are discussed in terms of theoretical and experimental calculations of residual stress. (AU)

• Processo FAPESP: 07/08534-3 - Síntese e caracterização de filmes ultrafinos de PZT
• Beneficiário: Elton Carvalho de Lima
• Modalidade de apoio: Bolsas no Brasil - Doutorado
• Processo FAPESP: 10/16504-0 - Influência de fatores extrínsecos sobre as propriedades de filmes ultrafinos de PZT
• Beneficiário: Eudes Borges de Araújo
• Modalidade de apoio: Auxílio à Pesquisa - Regular