Estimation of optical parameters of very thin films

Autor(es)

Birgin‚ E.G. ; Chambouleyron‚ I.E. ; Martınez‚ J.M. ; Ventura‚ S.D.

• Tipo de documento: Artigo Científico
• Fonte: APPLIED NUMERICAL MATHEMATICS; v. 47, n. 2, p. 109-119, 2003.

Resumo

In recent papers, the problem of estimating the thickness and the optical constants (refractive index and absorption coefficient) of thin films using only transmittance data has been addressed by means of optimization techniques. Models were proposed for solving this problem using linearly constrained optimization and unconstrained optimization. However, the optical parameters of "very thin" films could not be recovered with methods that are successful in other situations. Here we introduce an optimization technique that seems to be efficient for recovering the parameters of very thin films. (C) 2003 IMACS. Published by Elsevier B.V. All rights reserved. (AU)

• Processo FAPESP: 01/04597-4 - Métodos computacionais de otimização
• Beneficiário: José Mário Martinez Perez
• Modalidade de apoio: Auxílio à Pesquisa - Temático
• Processo FAPESP: 99/08029-9 - Otimização contínua de grande porte
• Beneficiário: Ernesto Julián Goldberg Birgin
• Modalidade de apoio: Auxílio à Pesquisa - Regular