Autor(es)

de Oliveira Hein, Luis Rogerio ^[1] ; de Oliveira, Jose Alberto ^[1] ; de Campos, Kamila Amato ^[1]

Afiliação do(s) autor(es)

^[1] UNESP Sao Paulo State Univ, LAIMat Mat Imaging Lab, Mat & Technol Dept, Fac Engn Guaratingueta, BR-12516410 Guaratingueta, SP - Brazil

• Tipo de documento: Artigo Científico
• Fonte: MICROSCOPY RESEARCH AND TECHNIQUE; v. 76, n. 9, p. 909-913, SEP 2013.
• Citações Web of Science: 2

Resumo

The correlative light-electron fractography technique combines correlative microscopy concepts to the extended depth-from-focus reconstruction method, associating the reliable topographic information of 3-D maps from light microscopy ordered Z-stacks to the finest lateral resolution and large focus depth from scanning electron microscopy. Fatigue striations spacing analysis can be precisely measured, by correcting the mean surface tilting with the knowledge of local elevation data from elevation maps. This new technique aims to improve the accuracy of quantitative fractography in fatigue fracture investigations. Microsc. Res. Tech. 76:909-913, 2013. (c) 2013 Wiley Periodicals, Inc. (AU)

• Processo FAPESP: 11/01835-3 - Fractografia correlativa: convergência de técnicas de microscopia e processamento digital de imagens para a caracterização quantitativa e qualitativa de micromecanismos de fratura
• Beneficiário: Luis Rogerio de Oliveira Hein
• Modalidade de apoio: Auxílio à Pesquisa - Regular
• Processo FAPESP: 11/01042-3 - Comportamento fractal de superfícies de fadiga de ligas aeronáuticas
• Beneficiário: José Alberto de Oliveira
• Modalidade de apoio: Bolsas no Brasil - Iniciação Científica