Autor(es)

De Leo, Stefano ^[1] ; Ducati, Gisele ^[2]

Afiliação do(s) autor(es)

^[1] Univ Estadual Campinas, Dept Appl Math, Campinas - Brazil

^[2] Fed Univ ABC, Ctr Math Computat & Cognit, Santo Andre, SP - Brazil

• Tipo de documento: Artigo Científico
• Fonte: EUROPEAN PHYSICAL JOURNAL PLUS; v. 135, n. 9 SEP 15 2020.
• Citações Web of Science: 0

Resumo

We investigate the lateral displacement of electronic waves when partially and totally reflected by a quaternionic potential. Following the analogy between Quantum Mechanics and Optics, we introduce a refractive index for the complex and the pure quaternionic case. For incidence greater than the critical one (total reflection), the quaternionic potentials amplify the lateral displacement found in the complex case. For incidence below the critical angle, we find, in the quaternionic case, an additional shift. The analytical formula found for the quaternionic lateral displacement gives the possibility to observe quantitative and qualitative differences between the complex and quaternionic Goos-Hanchen shift. (AU)

• Processo FAPESP: 19/06382-9 - Análise teórico-experimental da quebra de simetria transversal, dos deslocamentos laterais, dos desvios angulares e da oscilação da luz na propagação de feixes óticos em blocos dielétricos.
• Beneficiário: Stefano de Leo
• Modalidade de apoio: Auxílio à Pesquisa - Regular