Surface structure characterization of a (root 5 x root 5)-R26.6 degrees reconstruction of strontium titanate (001) by X-ray photoelectron diffraction

Autor(es)

Pancotti, A. ^[1] ; Silva, J. J. ^[1] ; de Siervo, A. ^[2] ; Landers, R. ^[2] ; Nascente, P. A. P. ^[3]

Afiliação do(s) autor(es)

^[1] Fed Univ Jatai, Special Acad Unit Exact & Tecnol Sci, Rodovia BR 364 Km 195, BR-75801615 Jatai, Go - Brazil

^[2] Univ Estadual Campinas, Gleb Wataghin Inst Phys, Rua Sergio Buarque Holanda 777, BR-13083859 Campinas, SP - Brazil

^[3] Univ Fed Sao Carlos, Dept Mat Engn, Rodovia Washington Luis Km 235, BR-13565905 Sao Carlos, SP - Brazil

• Tipo de documento: Artigo Científico
• Fonte: Surface Science; v. 715, JAN 2022.
• Citações Web of Science: 0

Resumo

The surface composition of a (root 5 x root 5)-R26.6 degrees (Rt5) reconstruction of a strontium titanate (001) single crystal surface was characterized by X-ray photoelectron spectroscopy (XPS), and its atomic surface structure was determined by a combination of low energy electron diffraction (LEED) and X-ray photoelectron diffraction (XPD). The comparison between experimental and theoretical XPD results involving multiple scattering calculations indicated that the analyzed Rt5 reconstruction of the SrTiO3 (001) surface has two possible terminations: 40% of SrO and 60% of TiO2. (AU)

• Processo FAPESP: 17/25983-8 - Revestimentos de Titânio, Nióbio e suas Ligas sobre Aço Inoxidável AISI 316L e Titânio
• Beneficiário: Pedro Augusto de Paula Nascente
• Modalidade de apoio: Auxílio à Pesquisa - Regular