Elemental mapping of large samples by external ion beam analysis with sub-millimeter resolution and its applications

Autor(es):Mostrar menos -

Silva, T. F. ^[1] ; Rodrigues, C. L. ^[1] ; Added, N. ^[1] ; Rizzutto, M. A. ^[1] ; Tabacniks, M. H. ^[1] ; Mangiarotti, A. ^[1] ; Curado, J. F. ^[2] ; Aguirre, F. R. ^[1] ; Aguero, N. F. ^[1] ; Allegro, P. R. P. ^[1] ; Campos, P. H. O. V. ^[1] ; Restrepo, J. M. ^[1] ; Trindade, G. F. ^[3] ; Antonio, M. R. ^[1] ; Assis, R. F. ^[1] ; Leite, A. R. ^[1]

Afiliação do(s) autor(es)

^[1] Univ Sao Paulo, Inst Fis, Rua Matao, Trav R 187, BR-05508090 Sao Paulo - Brazil

^[2] Ctr Univ FEI, Av Humberto de Alencar Castelo Branco, BR-09850901 Sao Bernardo Do Campo, SP - Brazil

^[3] Univ Surrey, Dept Mech Engn Sci, Surface Anal Lab, Guildford GU2 7XH, Surrey - England

• Tipo de documento: Artigo Científico
• Fonte: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIO; v. 422, p. 68-77, MAY 1 2018.
• Citações Web of Science: 2

Resumo

The elemental mapping of large areas using ion beam techniques is a desired capability for several scientific communities, involved on topics ranging from geoscience to cultural heritage. Usually, the constraints for large-area mapping are not met in setups employing micro- and nano-probes implemented all over the world. A novel setup for snapping large sized samples in an external beam was recently built at the University of Sao Paulo employing a broad MeV-proton probe with sub-millimeter dimension, coupled to a high-precision large range XYZ robotic stage (60 cm range In all axis and precision of 5 mu m ensured by optical sensors). An important issue on large area mapping is how to deal with the irregularities of the sample's surface, that may introduce artifacts in the images due to the variation of the measuring conditions. In our setup, we implemented an automatic system based on machine vision to correct the position of the sample to compensate for its surface irregularities. As an additional benefit, a 3D digital reconstruction of the scanned surface can also be obtained. Using this new and unique setup, we have produced large-area elemental maps of ceramics, stones, fossils, and other sort of samples. (AU)

• Processo FAPESP: 12/00202-0 - Investigações científicas nos museus paulistas
• Beneficiário: Márcia de Almeida Rizzutto
• Linha de fomento: Auxílio à Pesquisa - Regular
• Processo FAPESP: 13/19976-8 - Caracterização de bens culturais através de técnicas não destrutivas com feixes iônicos
• Beneficiário: Paula Rangel Pestana Allegro
• Linha de fomento: Bolsas no Brasil - Pós-Doutorado