Image Reconstruction Using Interval Simulated Annealing in Electrical Impedance Tomography

Autor(es)

Martins, Thiago de Castro ^[1] ; Leon Bueno de Camargo, Erick Dario ^[2] ; Lima, Raul Gonzalez ^[2] ; Passos Amato, Marcelo Britto ^[3] ; Guerra Tsuzuki, Marcos de Sales ^[1]

Afiliação do(s) autor(es)

^[1] Univ Sao Paulo, Dept Mechatron & Mech Syst Engn, Escola Politecn, BR-05508030 Sao Paulo - Brazil

^[2] Univ Sao Paulo, Dept Mech Engn, Escola Politecn, BR-05508030 Sao Paulo - Brazil

^[3] Univ Sao Paulo, Resp Intens Care Unit, Div Pulm, Hosp Clin, Fac Med, BR-01246903 Sao Paulo - Brazil

• Tipo de documento: Artigo Científico
• Fonte: IEEE Transactions on Biomedical Engineering; v. 59, n. 7, p. 1861-1870, JUL 2012.
• Citações Web of Science: 20

Resumo

Electrical impedance tomography (EIT) is an imaging technique that attempts to reconstruct the impedance distribution inside an object from the impedance between electrodes placed on the object surface. The EIT reconstruction problem can be approached as a nonlinear nonconvex optimization problem in which one tries to maximize the matching between a simulated impedance problem and the observed data. This nonlinear optimization problem is often ill-posed, and not very suited to methods that evaluate derivatives of the objective function. It may be approached by simulated annealing (SA), but at a large computational cost due to the expensive evaluation process of the objective function, which involves a full simulation of the impedance problem at each iteration. A variation of SA is proposed in which the objective function is evaluated only partially, while ensuring boundaries on the behavior of the modified algorithm. (AU)

• Processo FAPESP: 09/14699-0 - Aplicação do Recozimento Simulado com Vizinhança Adaptativa à Tomografia de Impedância Elétrica para Obtenção de Imagens Absolutas
• Beneficiário: Thiago de Castro Martins
• Modalidade de apoio: Bolsas no Brasil - Pós-Doutorado
• Processo FAPESP: 10/19380-0 - Recozimento simulado com avaliação incompleta da função objetivo aplicado à tomografia por impedância elétrica
• Beneficiário: Thiago de Castro Martins
• Modalidade de apoio: Auxílio à Pesquisa - Regular
• Processo FAPESP: 09/07173-2 - Aplicação do recozimento simulado à tomografia por impedância elétrica para a obtenção de imagens absolutas
• Beneficiário: Marcos de Sales Guerra Tsuzuki
• Modalidade de apoio: Auxílio à Pesquisa - Regular