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(Reference retrieved automatically from Web of Science through information on FAPESP grant and its corresponding number as mentioned in the publication by the authors.)

Image Reconstruction Using Interval Simulated Annealing in Electrical Impedance Tomography

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Author(s):
Martins, Thiago de Castro [1] ; Leon Bueno de Camargo, Erick Dario [2] ; Lima, Raul Gonzalez [2] ; Passos Amato, Marcelo Britto [3] ; Guerra Tsuzuki, Marcos de Sales [1]
Total Authors: 5
Affiliation:
[1] Univ Sao Paulo, Dept Mechatron & Mech Syst Engn, Escola Politecn, BR-05508030 Sao Paulo - Brazil
[2] Univ Sao Paulo, Dept Mech Engn, Escola Politecn, BR-05508030 Sao Paulo - Brazil
[3] Univ Sao Paulo, Resp Intens Care Unit, Div Pulm, Hosp Clin, Fac Med, BR-01246903 Sao Paulo - Brazil
Total Affiliations: 3
Document type: Journal article
Source: IEEE Transactions on Biomedical Engineering; v. 59, n. 7, p. 1861-1870, JUL 2012.
Web of Science Citations: 20
Abstract

Electrical impedance tomography (EIT) is an imaging technique that attempts to reconstruct the impedance distribution inside an object from the impedance between electrodes placed on the object surface. The EIT reconstruction problem can be approached as a nonlinear nonconvex optimization problem in which one tries to maximize the matching between a simulated impedance problem and the observed data. This nonlinear optimization problem is often ill-posed, and not very suited to methods that evaluate derivatives of the objective function. It may be approached by simulated annealing (SA), but at a large computational cost due to the expensive evaluation process of the objective function, which involves a full simulation of the impedance problem at each iteration. A variation of SA is proposed in which the objective function is evaluated only partially, while ensuring boundaries on the behavior of the modified algorithm. (AU)

FAPESP's process: 09/14699-0 - Applying the Simulated Annealing with Adaptive Neighborhood to the Electrical Impedance Tomography to Obtain Absolute Images
Grantee:Thiago de Castro Martins
Support Opportunities: Scholarships in Brazil - Post-Doctoral
FAPESP's process: 10/19380-0 - Simulated annealing with partial evaluation of objective function applied to electric impedance tomography
Grantee:Thiago de Castro Martins
Support Opportunities: Regular Research Grants
FAPESP's process: 09/07173-2 - Applying the simulated annealing to the electrical impedance tomography aiming the determination of absolute images
Grantee:Marcos de Sales Guerra Tsuzuki
Support Opportunities: Regular Research Grants