Structural depth profile and nanoscale piezoelectric properties of randomly oriented Pb(Zr0.50Ti0.50)O-3 thin films

Autor(es)

Lima, E. C. ^[1] ; Araujo, E. B. ^[1] ; Souza Filho, A. G. ^[2] ; Paschoal, A. R. ^[2] ; Bdikin, I. K. ^{[3, 4]} ; Kholkin, A. L. ^{[5, 6]}

Afiliação do(s) autor(es)

^[1] UNESP Univ Estadual Paulista, Dept Fis & Quim, Fac Engn Ilha Solteira, BR-15385000 Ilha Solteira, SP - Brazil

^[2] Univ Fed Ceara, Dept Fis, BR-60455900 Fortaleza, Ceara - Brazil

^[3] Univ Aveiro, Dept Mech Engn, P-3810193 Aveiro - Portugal

^[4] Univ Aveiro, TEMA, P-3810193 Aveiro - Portugal

^[5] Univ Aveiro, Dept Mat & Ceram Engn, P-3810193 Aveiro - Portugal

^[6] Univ Aveiro, CICECO, P-3810193 Aveiro - Portugal

• Tipo de documento: Artigo Científico
• Fonte: JOURNAL OF PHYSICS D-APPLIED PHYSICS; v. 45, n. 21 MAY 30 2012.
• Citações Web of Science: 12

Resumo

The structural properties of Pb(Zr0.50Ti0.50)O-3 thin films with no preferential orientation were studied throughout the film thickness. An analysis on depth profile shows the existence of a significant (1 0 0) alignment near the film-electrode interface. Nanoscale piezoelectric measurements demonstrate the existence of a self-polarization effect in the studied films. An increase in this effect with film thickness increasing from 200 to 710 nm suggests that Schottky barriers and/or mechanical coupling near the film-electrode interface cannot be the main mechanisms responsible for the self-polarization effect in the studied films. (AU)

• Processo FAPESP: 07/08534-3 - Síntese e caracterização de filmes ultrafinos de PZT
• Beneficiário: Elton Carvalho de Lima
• Modalidade de apoio: Bolsas no Brasil - Doutorado
• Processo FAPESP: 10/16504-0 - Influência de fatores extrínsecos sobre as propriedades de filmes ultrafinos de PZT
• Beneficiário: Eudes Borges de Araújo
• Modalidade de apoio: Auxílio à Pesquisa - Regular