Structural depth profile and nanoscale piezoelectric properties of randomly oriented Pb(Zr0.50Ti0.50)O-3 thin films

Author(s)

Lima, E. C. ^[1] ; Araujo, E. B. ^[1] ; Souza Filho, A. G. ^[2] ; Paschoal, A. R. ^[2] ; Bdikin, I. K. ^{[3, 4]} ; Kholkin, A. L. ^{[5, 6]}

Affiliation

^[1] UNESP Univ Estadual Paulista, Dept Fis & Quim, Fac Engn Ilha Solteira, BR-15385000 Ilha Solteira, SP - Brazil

^[2] Univ Fed Ceara, Dept Fis, BR-60455900 Fortaleza, Ceara - Brazil

^[3] Univ Aveiro, Dept Mech Engn, P-3810193 Aveiro - Portugal

^[4] Univ Aveiro, TEMA, P-3810193 Aveiro - Portugal

^[5] Univ Aveiro, Dept Mat & Ceram Engn, P-3810193 Aveiro - Portugal

^[6] Univ Aveiro, CICECO, P-3810193 Aveiro - Portugal

• Document type: Journal article
• Source: JOURNAL OF PHYSICS D-APPLIED PHYSICS; v. 45, n. 21 MAY 30 2012.
• Web of Science Citations: 12

Abstract

The structural properties of Pb(Zr0.50Ti0.50)O-3 thin films with no preferential orientation were studied throughout the film thickness. An analysis on depth profile shows the existence of a significant (1 0 0) alignment near the film-electrode interface. Nanoscale piezoelectric measurements demonstrate the existence of a self-polarization effect in the studied films. An increase in this effect with film thickness increasing from 200 to 710 nm suggests that Schottky barriers and/or mechanical coupling near the film-electrode interface cannot be the main mechanisms responsible for the self-polarization effect in the studied films. (AU)

• FAPESP's process: 07/08534-3 - Synthesis and characterization of PZT ultrathin films
• Grantee: Elton Carvalho de Lima
• Support Opportunities: Scholarships in Brazil - Doctorate
• FAPESP's process: 10/16504-0 - Influence of extrinsic factors on the properties of PZT ultrathin films
• Grantee: Eudes Borges de Araújo
• Support Opportunities: Regular Research Grants