Abstract
Microscopy techniques with spatiotemporal resolution are essential for the understanding of the spontaneous formation of self-organized structures in the electrochemical interface. The extraction of surface images by ellipsometric microscopy (ellipso-microscopy for surface imaging, EMSI) in real time is distinguished to be a non-destructive and very sensitive technique. Along with the spectroscopic module, it is possible to measure accurate values of thickness, refraction index and extinction coefficient of thin films formed on the metallic surface with lateral and depth precision in micro and nanoscale, respectively. This multi-user equipment, associated with the project Young Investigator of FAPESP, process: 2016/01817-9, aims to contribute to a systemic investigation of the physical chemistry of the surface reactions with spatiotemporal resolution, revealing important emerging properties related to the self-organizing process. (AU)
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