| Grant number: | 19/23181-7 |
| Support type: | Multi-user Equipment Program |
| Duration: | December 01, 2019 - November 30, 2026 |
| Field of knowledge: | Physical Sciences and Mathematics - Chemistry - Inorganic Chemistry |
| Principal researcher: | Ana Flávia Nogueira |
| Grantee: | Ana Flávia Nogueira |
| Home Institution: | Instituto de Química (IQ). Universidade Estadual de Campinas (UNICAMP). Campinas , SP, Brazil |
| Associated research grant: | 17/11986-5 - Research Division 1 - dense energy carriers, AP.PCPE |
| As informações de acesso ao Equipamento Multiusuário são de responsabilidade do Pesquisador responsável | |
| EMU web page: | Página do Equipamento Multiusuário não informada |
| Type of equipment: | Caracterização de Materiais - Análises de Superficies - Microscopia de sonda (AFM, STM) |
| Manufacturer: | Fabricante não informado |
| Model: | Modelo não informado |
Abstract
Atomic force microscopy (AFM) is a microscopy widely used for surface analysis of films, particularly organic films such as polymers and very thin films such as graphene films. The Kelvin probe force microscopy is a variant of the AFM and very important for analysing areas with different potentials on the film surface, allowing the location of regions of higher or lower electron density. This variant of traditional AFM microscopy measures the work function between sample and contact. With this new configuration being requested it will be possible to make images with higher resolution for the identification of different phases, components, as well as with much greater sensitivity for Kelvin measurements. (AU)
| Articles published in Agência FAPESP Newsletter about the research grant: |
| TITULO |
| Articles published in other media outlets (0 total): |
| More itemsLess items |
| VEICULO: TITULO (DATA) |
| VEICULO: TITULO (DATA) |