Characterization of nanostructured material images using fractal descriptors

Autor(es)

Florindo, Joao B. ^[1] ; Sikora, Mariana S. ^[2] ; Pereira, Ernesto C. ^[2] ; Bruno, Odemir M. ^[1]

Afiliação do(s) autor(es)

^[1] Univ Sao Paulo, Phys Inst Sao Carlos, Sao Carlos, SP - Brazil

^[2] Univ Fed Sao Carlos, Interdisciplinary Electrochem & Ceram Lab, BR-13560 Sao Carlos, SP - Brazil

• Tipo de documento: Artigo Científico
• Fonte: PHYSICA A-STATISTICAL MECHANICS AND ITS APPLICATIONS; v. 392, n. 7, p. 1694-1701, APR 1 2013.
• Citações Web of Science: 10

Resumo

This work presents a methodology to the morphology analysis and characterization of nanostructured material images acquired from FEG-SEM (Field Emission Gun-Scanning Electron Microscopy) technique. The metrics were extracted from the image texture (mathematical surface) by the volumetric fractal descriptors, a methodology based on the Bouligand-Minkowski fractal dimension, which considers the properties of the Minkowski dilation of the surface points. An experiment with galvanostatic anodic titanium oxide samples prepared in oxalyc acid solution using different conditions of applied current, oxalyc acid concentration and solution temperature was performed. The results demonstrate that the approach is capable of characterizing complex morphology characteristics such as those present in the anodic titanium oxide. (C) 2012 Elsevier B.V. All rights reserved. (AU)

• Processo FAPESP: 08/00180-0 - Investigação do mecanismo de formação de filmes porosos de TiO2 obtidos por anodização galvanostática
• Beneficiário: Mariana de Souza Sikora
• Modalidade de apoio: Bolsas no Brasil - Doutorado Direto
• Processo FAPESP: 11/01523-1 - Métodos de visão computacional aplicados à identificação e análise de plantas
• Beneficiário: Odemir Martinez Bruno
• Modalidade de apoio: Auxílio à Pesquisa - Regular