Characterization of nanostructured material images using fractal descriptors

Author(s)

Florindo, Joao B. ^[1] ; Sikora, Mariana S. ^[2] ; Pereira, Ernesto C. ^[2] ; Bruno, Odemir M. ^[1]

Affiliation

^[1] Univ Sao Paulo, Phys Inst Sao Carlos, Sao Carlos, SP - Brazil

^[2] Univ Fed Sao Carlos, Interdisciplinary Electrochem & Ceram Lab, BR-13560 Sao Carlos, SP - Brazil

• Document type: Journal article
• Source: PHYSICA A-STATISTICAL MECHANICS AND ITS APPLICATIONS; v. 392, n. 7, p. 1694-1701, APR 1 2013.
• Web of Science Citations: 11

Abstract

This work presents a methodology to the morphology analysis and characterization of nanostructured material images acquired from FEG-SEM (Field Emission Gun-Scanning Electron Microscopy) technique. The metrics were extracted from the image texture (mathematical surface) by the volumetric fractal descriptors, a methodology based on the Bouligand-Minkowski fractal dimension, which considers the properties of the Minkowski dilation of the surface points. An experiment with galvanostatic anodic titanium oxide samples prepared in oxalyc acid solution using different conditions of applied current, oxalyc acid concentration and solution temperature was performed. The results demonstrate that the approach is capable of characterizing complex morphology characteristics such as those present in the anodic titanium oxide. (C) 2012 Elsevier B.V. All rights reserved. (AU)

• FAPESP's process: 11/01523-1 - Computer vision methods applied to the identification and analysis of plants
• Grantee: Odemir Martinez Bruno
• Support type: Regular Research Grants
• FAPESP's process: 08/00180-0 - Investigation of the growth mechanism of porous TiO2 films prepared by galvanostatic anodization
• Grantee: Mariana de Souza Sikora
• Support type: Scholarships in Brazil - Doctorate (Direct)