Novel Approach for High-Resolution Elastic Behavior Assessment of Alloyed Strained Nanostructures

Autor(es)

Montoro, Luciano A. ^[1] ; Medeiros-Ribeiro, Gilberto ^{[1, 2]} ; Ramirez, Antonio J. ^[1]

Afiliação do(s) autor(es)

^[1] Brazilian Synchrotron Light Lab, BR-13083970 Campinas, SP - Brazil

^[2] Hewlett Packard Labs, Palo Alto, CA 94303 - USA

• Tipo de documento: Artigo Científico
• Fonte: Journal of Physical Chemistry C; v. 114, n. 29, p. 12409-12415, JUL 29 2010.
• Citações Web of Science: 3

Resumo

The quantification of the strain/stress state with high spatial resolution of nanostructured materials is essential for several applications and recent technologies. Several methods have been proposed and applied to address the strain state of such materials, for example, the traditional strain state analysis from high-resolution transmission electron microscopy (HRTEM) images. However, most of these methods fail when dealing with alloyed strained nanostructured materials. Such systems presents both intrinsic (due to chemical variations) and extrinsic (due to externally imposed stresses) strain which make proper analysis difficult. Here is presented a new methodology for high-resolution elastic behavior (strain, stress, elastic energy) assessment of alloyed strained nanostructures based on quantitative high-resolution transmission electron microscopy. The application of this technique to quantify the elastic behavior of the model system Si-Ge:Si(001) shows that this methodology arises as a remarkable tool for accurate chemical and elastic state evaluation, which can be applied to several strained alloyed nanostructures, such as epitaxial islands, nanowires, nanocrystals, and thin films. (AU)

• Processo FAPESP: 02/04151-9 - Analytical transmission electron microscope for spectroscopic nanocharacterization of materials.
• Beneficiário: Daniel Mario Ugarte
• Modalidade de apoio: Auxílio à Pesquisa - Regular
• Processo FAPESP: 07/05165-7 - Microscopia eletrônica de transmissão quantitativa (QHRTEM): desenvolvimentos e aplicação no estudo de um material semicondutor nanoestruturado
• Beneficiário: Luciano Andrey Montoro
• Modalidade de apoio: Bolsas no Brasil - Pós-Doutorado