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(Referência obtida automaticamente do Web of Science, por meio da informação sobre o financiamento pela FAPESP e o número do processo correspondente, incluída na publicação pelos autores.)

Investigation of the structural, optical and electrical properties of indium-doped TiO2 thin films grown by Pulsed Laser Deposition technique on low and high index GaAs planes

Texto completo
Autor(es):
Al Mashary, Faisal S. [1, 2] ; Felix, Jorlandio F. [3] ; Ferreira, Sukarno O. [4] ; de Souza, Daniele [5] ; Gobato, Yara G. [5] ; Chauhan, Jasbinder [1] ; Alexeeva, Natalia [1] ; Henini, Mohamed [1] ; Albadri, Abdulrahman M. [6] ; Alyamani, Ahmed Y. [6]
Número total de Autores: 10
Afiliação do(s) autor(es):
[1] Univ Nottingham, Sch Phys & Astron, Nottingham NG7 2RD - England
[2] Qassim Univ, Coll Sci, Dept Phys, Buraydah 14452 - Saudi Arabia
[3] Univ Brasilia, Inst Fis, Nucl Fis Aplicada, BR-70910900 Brasilia, DF - Brazil
[4] Univ Fed Vicosa, Dept Fis, BR-36570900 Vicosa, MG - Brazil
[5] Univ Fed Sao Carlos, Dept Fis, Sao Carlos, SP - Brazil
[6] King Abdulaziz City Sci & Technol, Natl Ctr Nanotechnol & Adv Mat, Riyadh 11442 - Saudi Arabia
Número total de Afiliações: 6
Tipo de documento: Artigo Científico
Fonte: MATERIALS SCIENCE AND ENGINEERING B-ADVANCED FUNCTIONAL SOLID-STATE MATERIALS; v. 259, SEP 2020.
Citações Web of Science: 0
Resumo

The properties of In-doped TiO2 grown by Pulsed Laser Deposition on (1 0 0) and (3 1 1)B GaAs substrates have been investigated. X-ray diffraction and photoluminescence results have shown that samples grown on (3 1 1)B GaAs planes have better crystallographic properties than those grown on (1 0 0). Both anatase and rutile phases were detected in samples with lower In-doping (In = 5 nm) while only rutile phase was observed for higher In-doped samples (In = 15 nm). Furthermore, In-doping adversely affected the electrical properties of samples grown on (1 0 0) substrates while it enhanced those of (3 1 1)B samples. Two shallow defects were detected in all samples except for (3 1 1)B sample (In = 15 nm) where three shallow defects were observed. The presence of more shallow defects in this sample is evidenced by a red-shift in the absorption spectrum. It was concluded that sample (3 1 1)B (In = 15 nm) is best among all other samples and makes it more suitable for solar cell applications. (AU)

Processo FAPESP: 18/01808-5 - Propriedades ópticas e de transporte em altos campos magnéticos de heteroestruturas e dispositivos semicondutores baseados em materiais bidimensionais (2d)
Beneficiário:Yara Galvão Gobato
Modalidade de apoio: Bolsas no Exterior - Pesquisa
Processo FAPESP: 16/10668-7 - Propriedades óticas, magneto-óticas, de transporte e magneto-transporte de materiais semicondutores bidimensionais baseados em materiais de transição dicalcogenados
Beneficiário:Yara Galvão Gobato
Modalidade de apoio: Auxílio à Pesquisa - Regular