Scientific MUE: acquisition of set dual beam microscope for in-situ sample prepara...
Evaluation of metallic alloys microstructure by correlative microscopy, backscatte...
Multi-user equipment approved in grant 2013/07793-6: Benchtop Scanning Electronic ...
Multi-user Equipment approved in grant 2013/07793-6:FT-IR Sprectrometer
EMU: Replacement of the Transmission Electron Microscope at the IBILCE/UNESP Multi...
Multi-user equipment approved in grant 2019/25707-6: scanning electron microscope
EMU: Acquisition of System for In-situ Analysis by Transmission Electron Microscopy