Grant number: | 13/26488-0 |
Support Opportunities: | Scholarships in Brazil - Master |
Start date: | April 01, 2014 |
End date: | March 31, 2016 |
Field of knowledge: | Engineering - Materials and Metallurgical Engineering - Nonmetallic Materials |
Principal Investigator: | Fenelon Martinho Lima Pontes |
Grantee: | Regina Aparecida Capeli da Silva |
Host Institution: | Faculdade de Ciências (FC). Universidade Estadual Paulista (UNESP). Campus de Bauru. Bauru , SP, Brazil |
Abstract At the current stage of technological development is desirable to obtain devices with dimensions (miniaturization) dwindling and can effectively play the role for which they were intended. So apply as ferroelectric thin films has become a challenge and a solution to the technological aspirations so that the properties to be explored should also be included in this configuration. Epitaxial thin films have attracted the attention of the research community around the world for a long period of time because their properties are often superior to those of polycrystalline thin films.In this project the use of polymerized citrate solutions with a high degree of chemical homogeneity of compounds Perovskite structure of Pb0.76Ca0.24TiO3 (PCT24) and LaNiO3 (LNO) systems are applied to prepare thin films textured/epitaxial. The growth of thin films PCT24 on LNO deposited on monocrystalline substrates such as LaAlO3 (100), LaAlO3 (001) and LaAlO3 (111) to check their preferred orientation and texturing will be done. The dependence of the dielectric/ferroelectric properties and electronic transport properties with respect to texturing will be evaluated for the formation of electronic devices for the LNO and PCT24 thin films, respectively. Also the comparative study of the electrical properties of thin films with LNO base electrode and platinum electrode will be held. Therefore, the effects of the arrangement and orientation of ferroelectric domains and texturing, the electrical properties of ferroelectric films will be evaluated and correlated with the crystallographic, microstructural and stoichiometric (chemical composition) of the material characteristics. | |
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