CV Lattes
Universidade Estadual Paulista (UNESP). Campus de Bauru. Faculdade de Ciências (FC) (Institutional affiliation from the last research proposal) Birthplace: Brazil
Experience as university professor at the level of educational scholarship. Experience in optical characterization of semiconductor films and in calculating optical constants of semiconductor films. Brief experience in deposition by magnetron reactive sputtering of GaN and TiO2 films. Experience in structural characterization of films by diffraction of X-rays. (Source: Lattes Curriculum)
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Some existing methods for determination of optical parameters of semiconductor films allow the determination of the refractive index, absorption coefficient, and thickness of thin films. However these methods are often limited by approximations.In this dissertation the development of a precise method for calculating the optical constants of semiconductor thin films from transmittance and …
Some existing methods allow the determination of the refractive index, absorption coefficient, and thickness of thin films. However, many of them are limited by approximations and others are not based on good physical grounds. In this project, the development of a method for calculating the optical constants of semiconductor thin films from transmittance and reflectance spectra is propose…
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