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On the Generation of Autocorrelated alpha-mu, eta-mu, and kappa-mu Fading Sequences

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Author(s):
Renno, Vanessa Mendes ; Santos Filho, Jose Candido Silveira
Total Authors: 2
Document type: Journal article
Source: IEEE TRANSACTIONS ON ANTENNAS AND PROPAGATION; v. 70, n. 12, p. 6-pg., 2022-12-01.
Abstract

Despite their mathematical flexibility, great fit to empirical data, and increasing popularity, the alpha-mu, eta-mu, and kappa-mu fading models have to date no simulation framework as general as the models themselves. In this work, we overcome this drawback by proposing a unified simulation method for alpha-mu, eta-mu, and kappa-mu fading processes that accommodates full-range values of all the fading parameters. Not less important, the proposed method is simple, exactly matches the fading models' first-order statistics, and well approximates their second-order statistics. We derive the analytical expressions for the proposed method and optimize a crucial simulation parameter to improve the match for the second-order statistics. In passing, we obtain useful series representations and asymptotic expressions for essential first- and second-order statistics of the fading models investigated. Our results are fully validated via the Monte Carlo simulation. (AU)

FAPESP's process: 18/20179-9 - Advanced Simulation of Generalized Wireless Channels
Grantee:Vanessa Mendes Rennó
Support Opportunities: Scholarships in Brazil - Doctorate