Advanced search
Start date
Betweenand


Blur Parameter Identification Through Optimum-Path Forest

Full text
Author(s):
Pires, Rafael G. ; Fernandes, Silas E. N. ; Papa, Joao Paulo ; Felsberg, M ; Heyden, A ; Kruger, N
Total Authors: 6
Document type: Journal article
Source: COMPUTER ANALYSIS OF IMAGES AND PATTERNS; v. 10425, p. 11-pg., 2017-01-01.
Abstract

Image acquisition processes usually add some level of noise and degradation, thus causing common problems in image restoration. The restoration process depends on the knowledge about the degradation parameters, which is critical for the image deblurring step. In order to deal with this issue, several approaches have been used in the literature, as well as techniques based on machine learning. In this paper, we presented an approach to identify blur parameters in images using the Optimum-Path Forest (OPF) classifier. Experiments demonstrated the efficiency and effectiveness of OPF when compared against some state-of-the-art pattern recognition techniques for blur parameter identification purpose, such as Support Vector Machines, Bayesian classifier and the k-nearest neighbors. (AU)

FAPESP's process: 14/16250-9 - On the parameter optimization in machine learning techniques: advances and paradigms
Grantee:João Paulo Papa
Support Opportunities: Regular Research Grants
FAPESP's process: 14/12236-1 - AnImaLS: Annotation of Images in Large Scale: what can machines and specialists learn from interaction?
Grantee:Alexandre Xavier Falcão
Support Opportunities: Research Projects - Thematic Grants