Method to obtain nonuniformity information from field emission behavior

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Author(s):	Dall'Agnol, Fernando F. ; de Paulo, Alexandre C. ; Paredez, Pablo ; den Engelsen, Daniel ; Santos, Thebano E. A. ; Mammana, Victor P. Total Authors: 6
Document type:	Journal article
Source:	JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B; v. 28, n. 3, p. 9-pg., 2010-05-01.
Abstract
This article describes the characterization of field emission from a planar cathode to a spherical anode with the approach curve method (ACM). In such a diode configuration the electric field strength at the cathode surface is nonuniform. This nonuniformity gives an extra degree of freedom and it allows the interpretation of the current-voltage and voltage-distance (Vxd) curves in terms of nonuniformity. The authors apply the ACM to Cu emitters to explain the nonlinearity of the Vxd curve in ACM measurements. This analysis provides a good insight into field emission phenomena, supporting a method for nonuniformity characterization based on field emission behavior. (C) 2010 American Vacuum Society. [DOI: 10.1116/1.3327928] (AU)