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Role of residual stress on phase transformations of Pb(Zr0.50Ti0.50)O-3 thin films obtained from chemical route

Full text
Author(s):
Lima, E. C. ; Araujo, E. B.
Total Authors: 2
Document type: Journal article
Source: Ferroelectrics; v. 499, n. 1, p. 8-pg., 2016-01-01.
Abstract

The effects of heat treatment on the phase transformations of lead zirconate titanate Pb(Zr0.50Ti0.50)O-3 (PZT) thin films were studied. The pyrolysis temperature directly affected the densification, residual stresses, and suppression of the pyrochlore phase observed in the studied films. The evolution of the crystalline phases and the residual stress were characterized by different temperatures of pyrolysis in PZT thin films, using the X-ray diffraction technique. The phase transformations in the films are discussed in terms of theoretical and experimental calculations of residual stress. (AU)

FAPESP's process: 07/08534-3 - Synthesis and characterization of PZT ultrathin films
Grantee:Elton Carvalho de Lima
Support Opportunities: Scholarships in Brazil - Doctorate
FAPESP's process: 10/16504-0 - Influence of extrinsic factors on the properties of PZT ultrathin films
Grantee:Eudes Borges de Araújo
Support Opportunities: Regular Research Grants