New Setup for SEE Measurements in South America

Author(s)

Aguiar, Y. A. P. ; Medina, N. H. ; Added, N. ; Macchione, E. L. A. ; Nascimento, S. G. ; Leite, A. R. ; Silveira, M. A. G. ; Leray, JL ; Mekki, J ; Tsiligiannis, G

• Document type: Journal article
• Source: 2017 17TH EUROPEAN CONFERENCE ON RADIATION AND ITS EFFECTS ON COMPONENTS AND SYSTEMS (RADECS); v. N/A, p. 4-pg., 2017-01-01.

Abstract

The new setup for Single Event Effects studies at LAFN-USP, Brazil is described in this work. The new beam line is dedicated to production of large area, high uniformity and low intensity heavy-ions beams to irradiate electronic devices. Its design relies on defocusing and multiple scattering techniques to obtain desired beam characteristics. Beam uniformity measured was better than 90%. (AU)

• FAPESP's process: 12/03383-5 - Development of methodology for radiation tests on electronic components
• Grantee: Nilberto Heder Medina
• Support Opportunities: Regular Research Grants