Ionic Beam System for IRradiation and Applications (SAFIIRA)

• Grant number: 23/16053-8
• Support Opportunities: Regular Research Grants
• Start date: March 01, 2024
• End date: February 28, 2026
• Field of knowledge: Physical Sciences and Mathematics - Physics - Nuclear Physics
• Principal Investigator: Nilberto Heder Medina
• Grantee: Nilberto Heder Medina
• Host Institution: Instituto de Física (IF). Universidade de São Paulo (USP). São Paulo , SP, Brazil
• Associated researchers: Eduardo Luiz Augusto Macchione ; Luís Eduardo Seixas Júnior ; Manuela Cavallaro ; Marcilei Aparecida Guazzelli ; Marco Antonio Assis de Melo ; Marco Bregant ; Nemitala Added ; Roberto Baginski Batista Santos ; Saulo Finco ; Tiago Roberto Balen ; Vitor Ângelo Paulino de Aguiar

Abstract

Currently, several groups of researchers in Brazil have intensified studies to develop autonomy with respect to nuclear and aerospace science and technologies. A critical aspect of this development process is understanding the effects to which embedded systems are subject when exposed to space radiation. In this context, researchers from the Physics Institute of the University of São Paulo dedicated efforts to developing methods and scientific instrumentation aimed at these studies, allowing the Pelletron 8UD heavy ion accelerator to become one of the most important Brazilian facilities capable of carrying out device tests. candidate electronics to compose embedded space systems and electronic components to be used in environments with high radiation. In this project, particle detectors will also be developed for use in experiments to study nuclear reaction mechanisms. The main objectives of this project are: the development of methodologies for the study of non-destructive and destructive effects of heavy ion beams on electronic devices and systems and also the development and characterization of detectors for the study of the mechanism of nuclear reactions.Recently, a new beam line, called SAFIIRA (Portuguese acronym to Ionic Beam System for IRradiation and Applications), was installed at the Open Nuclear Physics Laboratory (LAFN) of the University of São Paulo, and specific instrumentation was improved to test and qualify the susceptibility of electronic devices to the effects due to the incidence of heavy ions, instrumentation was developed for real-time monitoring of the ionic beams produced by the Pelletron 8UD accelerator, as well as the possibility of carrying out the characterization of detectors for the study of nuclear reactions. The experiments will also be carried out in well-established collaborations with research groups from national and international universities and also with Brazilian research institutes. (AU)

Scientific publications

(4)

(References retrieved automatically from Web of Science and SciELO through information on FAPESP grants and their corresponding numbers as mentioned in the publications by the authors)

VILAS BOAS, ALEXIS CRISTIANO; ALBERTON, SAULO GABRIEL; GARCIA, PAULO ROBERTO; MEDINA, NILBERTO H.; AGUIAR, VITOR ANGELO P.; MELO, MARCO ANTONIO A.; SANTOS, ROBERTO BAGINSKI B.; GIACOMINI, RENATO C.; CAVALCANTE, TASSIO, V; SEIXAS JR, LUIS EDUARDO; et al. Neutron-induced effects on a commercial GaN High Electron Mobility Transistor. 2024 38TH SYMPOSIUM ON MICROELECTRONICS TECHNOLOGY AND DEVICES, SBMICRO 2024, v. N/A, p. 4-pg., 2024-01-01. (22/09131-0, 23/16053-8, 20/04867-2, 18/25225-9)

GUAZZELLI, M. A.; AVANZI, L. H.; AGUIAR, V. A. P.; VILAS-BOAS, A. C.; ALBERTON, S. G.; MASUNAGA, S. H.; CHINAGLIA, E. F.; ARAKI, K.; NAKAMURA, M.; TOYAMA, M. M.; et al. Effects of neutron radiation on the thermal conductivity of highly oriented pyrolytic graphite. DIAMOND AND RELATED MATERIALS, v. 151, p. 10-pg., 2025-01-01. (23/16053-8)

GOBATTO, LEONARDO; BENEVENUTI, FABIO; BASTOS, RODRIGO POSSAMAI; ADDED, NEMITALA; ALBERTON, SAULO; MACCHIONE, EDUARDO; AGUIAR, VITOR; MEDINA, NILBERTO; KASTENSMIDT, FERNANDA; AZAMBUJA, JOSE RODRIGO. Early Radiation-Induced Soft-Error Assessment of Arm Cortex-M SoCs Through Fault Injection. IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, v. 25, n. 1, p. 9-pg., 2025-03-01. (23/16053-8)

AGUIAR, VITOR A. P.; MEDINA, NILBERTO H.; ADDED, NEMITALA; ALBERTON, SAULO G.; MACCHIONE, EDUARDO L. A.; GUAZZELLI, MARCILEI A.; MELO, MARCO A. A.; OLIVEIRA, JULIANO A.; GIACOMINI, RENATO C.; AGUIRRE, FERNANDO R.; et al. Evaluation of Funnel Models on Calculation of Ion-Induced Collected Charge. IEEE TRANSACTIONS ON ELECTRON DEVICES, v. N/A, p. 6-pg., 2024-11-22. (23/16053-8)