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EMU: Optimization of the Bruker D8-Advance X-ray diffractometer of LAMULT/IFGW for the investigation of polycrystalline samples

Abstract

This is an upgrade proposal of the Bruker D8 Advance X-ray diffractometer located in the Multiuser Laboratory (LAMULT) at IFGW, acquired through Fapesp Process no. 09/54047-2. This equipment has exceptional mechanics in relation to X-ray diffractometers available on the market, allowing an excellent precision and reproducibility in the movements carried out during a scan. Furthermore, as this is not table-top equipment but rather a medium-sized equipment, the source-sample and sample-detector distances are large enough so that the angular resolution of the diffractograms, under optimized conditions, is is superior compared to benchtop X-ray diffractometers. Furthermore, this equipment allows different configurations so that samples of different natures can be studied. In addition to the standard configuration for powder diffraction (theta-2theta with divergent beam), an Euler circle can be attached, enabling sample movement with several degrees of freedom. Additionally, a Göbel mirror close to the source is available, transforming the divergent beam exiting the X-ray tube into a parallel beam toward the sample, with the option of Soller slits to collimate the scattered beam. These options allow single-crystalline samples and epitaxial or polycrystalline thin films to also be studied. Thus, this equipment, if well used and with the appropriate accessories, is capable of generating high quality X-ray diffraction and reflectivity data, and can serve users of the IFGW/UNICAMP Multiuser Laboratory in a wide range of situations and problems for years to come. (AU)

Articles published in Agência FAPESP Newsletter about the research grant:
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VEICULO: TITULO (DATA)
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